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市場調查報告書
商品編碼
1938932
原子力顯微鏡市場-全球產業規模、佔有率、趨勢、機會及預測(依產品、等級、應用、地區及競爭格局分類,2021-2031年)Atomic Force Microscopy, Market - Global Industry Size, Share, Trends, Opportunity, and Forecast, Segmented By Offering, By Grade, By Application, By Region & Competition, 2021-2031F |
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全球原子力顯微鏡 (AFM) 市場預計將從 2025 年的 5.0225 億美元成長到 2031 年的 7.0722 億美元,複合年成長率達到 5.87%。
原子力顯微鏡 (AFM) 採用高解析度掃描探測器法,利用尖銳的懸臂梁來表徵奈米尺度的表面形貌和物理性質。市場成長的主要驅動力是半導體元件的持續小型化和奈米技術研究經費的增加,這兩者都需要精密計量來進行缺陷分析和品質保證。這種工業需求十分顯著;根據 SEMI 的一份報告,預計到 2024 年,全球半導體製造設備銷售額將達到創紀錄的 1130 億美元,這凸顯了強勁的資本投資環境,為檢測系統的應用提供了有力支撐。
| 市場概覽 | |
|---|---|
| 預測期 | 2027-2031 |
| 市場規模:2025年 | 5.0225億美元 |
| 市場規模:2031年 | 7.0722億美元 |
| 複合年成長率:2026-2031年 | 5.87% |
| 成長最快的細分市場 | 軟體 |
| 最大的市場 | 亞太地區 |
儘管取得了這樣的發展,但與光學顯微鏡相比,原子力顯微鏡在掃描速度方面仍面臨顯著挑戰。緩慢的掃描過程限制了樣品吞吐量,使得原子力顯微鏡難以應用於對循環時間要求極高的大規模生產環境。因此,這瓶頸通常限制了原子力顯微鏡的應用,使其只能用於離線實驗室測試,而無法用於即時在線連續生產監控。
對半導體晶圓檢測和故障分析日益成長的需求是推動全球原子力顯微鏡 (AFM) 市場發展的主要因素。隨著製造節點尺寸的縮小,製造商越來越依賴 AFM 出色的垂直解析度來識別肉眼不可見的缺陷並測量光學技術無法測量的關鍵尺寸。產業龐大的生產規模進一步加劇了這種依賴性,因為在高價值製造中,精確的計量對於產量比率管理至關重要。根據半導體產業協會 (SIA) 2025 年 2 月發布的報告,預計 2024 年全球半導體銷售額將達到創紀錄的 6,276 億美元,這表明大規模的工業活動需要先進的檢測工具。因此,晶圓廠正在擴大部署自動化 AFM 系統,以在不斷擴大的生產線上維持品管。
同時,在持續的公共資金支持下,奈米技術和奈米材料研究為市場擴張奠定了堅實的基礎。原子力顯微鏡(AFM)是原子級材料表徵的黃金標準,對於研究新型複合材料和生物樣品至關重要。旨在促進科學領先地位的聯邦津貼進一步強化了這個研究環境。根據國家奈米技術協調辦公室2024年12月發布的報告,總統2025會計年度預算提案要求為國家奈米技術舉措撥款超過22億美元。這筆穩定的資金使學術機構和政府實驗室能夠購買先進設備,直接為主要市場參與者創造收入。布魯克公司在2025年發布的報告也印證了這一趨勢,報告稱其旗下包含原子力顯微鏡業務的BSI NANO部門在2024會計年度的銷售額將達到11億美元。
全球原子力顯微鏡 (AFM) 市場向大規模生產領域擴張的一大障礙是其固有的掃描速度限制。與幾乎瞬時獲取表面數據的光學檢測系統不同,AFM 依賴機械過程,即物理探針在樣品表面移動,這顯著延長了數據採集時間。這一根本性限制造成了巨大的吞吐量差距,使得標準 AFM 設備不適用於即時在線連續晶圓檢測,而快速的循環時間是晶圓檢測的關鍵性能要求。
由於現代半導體製造規模龐大,無法跟上生產線速度直接阻礙了市場成長。該產業的運作要求快速計量解決方案能夠在不影響產量比率。根據SEMI統計,2024年第二季全球晶圓製造產能達到每季4,050萬片。鑑於如此龐大的運作需求,製造商無法承受原子力顯微鏡(AFM)用於常規檢測所帶來的延遲。因此,AFM目前主要局限於離線故障分析和研發工作,這使得供應商無法獲得用於高速在線連續製程控制設備的大規模資金。
全自動掃描工作流程的進步正在改變市場格局,消除了原子力顯微鏡(AFM)以往陡峭的學習曲線。過去,取得高品質的奈米級資料需要專業操作員手動調整複雜的回饋設置,而現代系統則利用智慧演算法自主處理探針與樣品之間的接觸控制和掃描最佳化。這種向使用者友善設計的轉變,使得AFM的應用範圍擴展到非表面科學領域的專業人士,無需專門培訓即可將其用於常規測量,從而拓展了AFM的應用領域。這種易用性的提升帶來了顯著的財務回報:2025年2月,Park Systems公佈了2024會計年度的年銷售額為1750億韓元。這一數字主要得益於該公司自動化計量解決方案在工業和學術領域的日益普及。
同時,隨著研究人員尋求僅憑形貌資訊無法獲得的全面材料資訊,對關聯分析和多模態平台的需求日益成長。透過將原子力顯微鏡 (AFM) 與拉曼光譜或掃描電子顯微鏡等互補技術相結合,這些混合系統能夠同時從同一奈米尺度區域收集物理、化學和結構數據。這種協同作用在複雜異質材料的分析中尤其重要,因為精確表徵需要將結構細節與化學成分關聯起來。對這種多方面分析的需求正在推動該領域的快速成長。 2024 年 6 月,牛津儀器公司在 2024 年年度報告中宣布,其材料與表徵部門的收入達到 2.522 億英鎊,同比成長 11.4%,這主要得益於其先進顯微鏡產品組合(包括關聯原子力顯微鏡和拉曼系統)的強勁銷售。
The Global Atomic Force Microscopy (AFM) Market is projected to expand from USD 502.25 Million in 2025 to USD 707.22 Million by 2031, achieving a CAGR of 5.87%. AFM employs a high-resolution scanning probe method that uses a sharp-tipped cantilever to assess surface topography and physical characteristics at the nanoscale. Market growth is primarily driven by the ongoing miniaturization of semiconductor components and elevated funding for nanotechnology research, both of which demand precise metrology for defect analysis and quality assurance. This industrial need is substantial; SEMI reported that in 2024, global sales of total semiconductor manufacturing equipment were expected to hit a record $113 billion, highlighting the strong capital expenditure climate that supports the acquisition of inspection systems.
| Market Overview | |
|---|---|
| Forecast Period | 2027-2031 |
| Market Size 2025 | USD 502.25 Million |
| Market Size 2031 | USD 707.22 Million |
| CAGR 2026-2031 | 5.87% |
| Fastest Growing Segment | Software |
| Largest Market | Asia Pacific |
Despite this growth, the technology faces a major obstacle regarding scanning speed relative to optical microscopy. The slow nature of the scanning process constrains sample throughput, making it difficult to incorporate AFM into high-volume manufacturing environments where fast cycle times are critical. As a result, this bottleneck frequently restricts the technology to offline laboratory examinations rather than real-time, inline production monitoring.
Market Driver
The escalating demand for semiconductor wafer inspection and failure analysis serves as the primary catalyst driving the Global Atomic Force Microscopy (AFM) Market. As fabrication nodes decrease in size, manufacturers depend more on AFM's exceptional vertical resolution to identify non-visual defects and measure critical dimensions that optical techniques cannot resolve. This dependency is amplified by the industry's vast production scale, where accurate metrology is vital for yield management in high-value manufacturing. According to the Semiconductor Industry Association in February 2025, global semiconductor sales attained a record $627.6 billion in 2024, demonstrating the massive industrial activity requiring advanced inspection tools. Consequently, fabrication plants are adopting automated AFM systems to maintain quality control across their growing production lines.
Concurrently, the growth of nanotechnology and nanomaterials research serves as a strong basis for market expansion, supported by continued public funding. AFM is the standard instrument for characterizing material properties at the atomic scale, crucial for studying new composites and biological specimens. This research environment is bolstered by federal grants designed to promote scientific leadership; the National Nanotechnology Coordination Office reported in December 2024 that the President's 2025 Budget requested over $2.2 billion for the National Nanotechnology Initiative. This steady funding enables academic and government labs to purchase advanced equipment, directly generating revenue for major market players. Highlighting this trend, Bruker Corporation reported in 2025 that its BSI NANO segment, which includes its AFM business, achieved fiscal year 2024 revenue of $1.10 billion.
Market Challenge
A critical bottleneck preventing the Global Atomic Force Microscopy (AFM) Market from entering the high-volume manufacturing sector is the inherent limitation in scanning speed. In contrast to optical inspection systems that acquire surface data nearly instantly, AFM depends on a physical probe moving across the sample, a mechanical method that greatly prolongs data collection time. This fundamental restriction causes a significant throughput gap, making standard AFM setups inappropriate for real-time, inline wafer inspection where fast cycle times are a key performance requirement.
This inability to keep pace with production line speeds directly hinders market growth due to the vast scale of modern semiconductor fabrication. The industry operates at volumes necessitating rapid metrology solutions to sustain yield without impeding output. According to SEMI, global installed wafer fab capacity reached 40.5 million wafers per quarter during the second quarter of 2024. Given such immense throughput demands, manufacturers cannot accept the latency associated with atomic force microscopy for general inspection. As a result, AFM remains primarily limited to offline failure analysis and R&D tasks, preventing vendors from accessing the significantly larger capital budgets designated for high-speed, inline process control machinery.
Market Trends
The progression of fully automated scanning workflows is transforming the market by removing the steep learning curve once required for atomic force microscopy. While obtaining high-quality nanoscale data previously demanded expert operators to manually tune complex feedback settings, modern systems now utilize intelligent algorithms to autonomously handle tip-sample engagement and scan optimization. This transition toward user-friendly design enables various industries to use AFM for routine measurements without specialized training, expanding access beyond dedicated surface scientists. This operational shift is driving significant financial results; Park Systems reported in February 2025 that its annual sales revenue reached 175 billion KRW in 2024, a figure attributed to the growing adoption of its automated metrology solutions in both industrial and academic fields.
At the same time, the rise of correlative and multi-modal platforms is increasing as researchers demand comprehensive material insights that topography alone cannot supply. By combining AFM with complementary methods like Raman spectroscopy or scanning electron microscopy, these hybrid systems permit the simultaneous collection of physical, chemical, and structural data from the same nanoscale area. This synergy is especially vital for analyzing complex heterogeneous materials where linking structural details with chemical composition is necessary for precise characterization. The need for such multifaceted analysis is actively fueling segment growth; Oxford Instruments stated in June 2024 that its Materials & Characterisation segment achieved revenue of £252.2 million in its 2024 annual report, representing an 11.4% rise driven by strong sales of its advanced microscopy portfolio, including correlative AFM and Raman systems.
Report Scope
In this report, the Global Atomic Force Microscopy (AFM) Market has been segmented into the following categories, in addition to the industry trends which have also been detailed below:
Company Profiles: Detailed analysis of the major companies present in the Global Atomic Force Microscopy (AFM) Market.
Global Atomic Force Microscopy (AFM) Market report with the given market data, TechSci Research offers customizations according to a company's specific needs. The following customization options are available for the report: